Overview

A comprehensive measurement and analysis platform for semiconductor devices testing. It is designed to intergrate advanced hardware and with user friendly software to automate IV (Current-Voltage) curve testing, opens/shorts detection and parametric measurements

Features

• Input Setup: Configurable test pins, force/sense connections, compliance limits, NPLC, auto-validation.
• Output Results: Real-time pass/fail status with biasing measurement results.
• Global Settings: 2-wire or 4-wire sensing modes, definable VCC biasing, project/data paths.
• Measurement Info: Test timing, number of devices tested, pass/fail counts.
• Graphing & Plotting: Real-time IV curve plotting with zoom, pan, cursors, and annotation tools.
• Data Recording: Automated CSV logging with timestamped filenames, auto-save graphs in JPG format.
• Reports: Excel-based summaries consolidating lot, DUTs, and test comparisons.