Specialized Custom Solutions to Individual Companies
Besides the software categories in the navigation bar, we also provide custom solutions to individual companies.
It supports a wide range of instruments from R&D to fully integrated semiconductor measurement systems.
If you wish to know more of this products or have a product in mind,
Leios CCRES
The Leios CRES contact resistance test system forces a current through the contact and measures the voltage drop developed across the contact in four-wire measurement method using the smallest resistance measurement range of 1Ω. The results are shown in high resolution pin graphics colors representing the different resistance range. Configurable pin definition which can be mapped directly to the layout of the your test socket. This allows the user to quickly determined the gross failure regions on the test socket for analysis.
Learn moreWe also created the following custom solutions for our clients:
- Leios Capacitance Test / ImportToExcel
- Electro-migration / TDDB
- Drift Voltage Measurement System
- Leios Material Analysis
- Leios PLT (Pulse Life Test) / THBLP
- Leios SIR (Surface Insulation Resistance)
- MaxMTC1
If you wish to know more of this products or have a product in mind,