Custom Solution | Leios CCRES
The Leios CRES contact resistance test system forces a current through the contact and measures the voltage drop developed across the contact in four-wire measurement method using the smallest resistance measurement range of 1Ω. The results are shown in high resolution pin graphics colors representing the different resistance range. Configurable pin definition which can be mapped directly to the layout of the your test socket. This allows the user to quickly determined the gross failure regions on the test socket for analysis.
Features of Leios CCRES
- Measures very low resistance
- 480 channel counts (scalable by groups of 480 channels)
- Color coded pin map display based on user specifiable resistor range
- Customizable to link with temperature chamber or punching mechanism PLC
- Current pumping option available
- Build-in statistical calculation of mean, standard deviation, upper and lower 90%
- Four-terminal measurement method
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