SysMon | IMON - Current Monitoring

Overview

IMON is a high-precision current monitoring solution designed for real-time analysis and testing of semiconductor devices. With its advanced features, IMON enables engineers to capture critical current measurements with ease and accuracy.

Key Features

• Real-time current monitoring with high precision
• Supports a wide range of semiconductor devices
• User-friendly interface for easy configuration and data analysis
• Data logging and export capabilities for offline analysis
• Integration with existing testing and measurement systems