TMXpert Semiconductor Characterization System
TMXpert is a comprehensive semiconductor characterization system designed to meet the needs of semiconductor device manufacturers and researchers. It provides advanced measurement capabilities for various semiconductor parameters, ensuring accurate and reliable data for device analysis.
It supports a wide range of instruments from R&D to fully integrated semiconductor measurement systems.
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Our Products
Easy IV
Simple and familiar front panel selection
- A familiar front panel selection interface for fast transistor output characteristic tests.
- Polarity and other key test parameters changes on the fly.
- Real-time collector supply adjustment via slider control or mouse scroll wheel.
- Quick device checks (e.g. Opens or shorts) without the need for programming.
- Produces high speed sweep plots in real time (10 plots with 100 points in less than 1s).
- Emulate AC mode for gate leakage measurement through ellipsoidal IV trace.
- Test and append plot function for easy IV test pass and fail comparison.
Foot Switch and other key advantages.
- Integrated foot switch allows a hands free method to start and stop a test for manual probing.
- Save and recall unlimited test recipes.
- Programmable data point increments.
- Increments/scaling can be linear or logarithmic.
- Auto-trigger alert message when hard drive capacity reaches low levels.
- Auto instrument connection.
- Simple hardware configuration.
Fast IV
IV curve plots immediately upon connecting to the DUT
The Fast IV plots the IV curve immediately upon contact to the DUT and gives the feel of an analog curve tracer like the Tektronix 370 series. The Keysight B2900A sources voltage or current in rapid continous loops to achieve fast curve plotting response.
Offers a familiar analogue curve tracer front panel
The TMXpert Fast IV software integrates a familiar analogue curve tracer front panel for the digital acquisition and display. This reduces the learning curve for those who are already comfortable with the style of curve tracing for characterization of new devices, failure analysis , generation of data sheet specifications and QA inspection. The TMXpert Fast IV software is available for Windows and Mac operating systems.
Old style curve tracing with new style data tracability
While the curve tracing front panel maintains a familiar old style test setup, it provides up to date data tracability standards (e.g. auto-datalogging to CSV file, auto-image generation in jpg format and operator/username login tracability. It is able to store and retrieve unlimited test setups. The TMXpert Fast IV software is available for Windows and Mac operating systems.
TMXpert Semiconductor - Semiconductor device characterization.
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Learn moreTMXpert ACT - Automated curve tracing for multi-channel devices.
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TMXpert 4PP - Inline 4-Point Probe Resistivity.
TMXpert uses an in-line 4-point probe to measure resistivity, applying user-defined correction factors for accurate calculations, and its software automates testing, data logging, statistical analysis, and report generation.
Learn moreTMXpert Hall Effect - Hall Effect Measurement
The TMXpert Hall Effect system offers fully integrated software to control instruments for Hall Effect and Van Der Pauw measurements, providing real-time data and a comprehensive suite of electrical and carrier property measurements.
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TMXpert Super-Conductor - Super-conductivity Measurement
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