SysMon | Voltage Monitoring
Overview
VMON is a production‑ready monitoring system designed for high‑voltage burn‑in and reliability testing of power semiconductor devices. It combines multi‑channel switching, precision measurement, and chamber‑ready harnessing to deliver reliable leakage and voltage data across large device populations—without slowing down your line.
Key Features
- Scale without complexity: Monitor up to 336 DUTs across four independent slots in a single setup.
- Actionable data: Capture per‑device leakage and key node voltages during stress to spot early‑life failures and outliers.
- Built for uptime: Robust switching topology and fault‑isolation tools reduce downtime from arc events and wiring issues.
- Chamber‑ready: Compact, rack‑mountable design with integrated cooling and vibration‑resistant wiring.
- Flexible configurations: Supports various voltage ranges and measurement types to fit your specific testing
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