SysMon | Voltage Monitoring

The VMON System, is an advanced setup designed to monitor and control high-voltage semiconductor tests. Integrating precision instruments such as Keithley DMMs, switch mainframes, and Agilent monitoring tools, the system ensures accurate data collection across up to 336 test channels, all connected through DSUB-50 interfaces. This robust infrastructure supports the stringent reliability requirements of modern semiconductor devices.

A key feature of the system is its burn-in chamber design, where IGBTs and other devices undergo stress testing. Each chamber houses resistor boards, IGBT motherboards, and modular wire cards, allowing simultaneous testing of hundreds of devices. With manual switching between VCC and GND references, engineers can precisely measure both voltage and current under demanding operating conditions, ensuring thorough validation of device performance.

The VMON platform goes beyond monitoring—it actively detects failure mechanisms such as DUT shorts, relay arc-ing, and wiring issues. Powered by the SysMon VMSS software, the system provides real-time datalogging, resistance checks, and fault analysis. Coupled with high-stress testing for 600V to 970V IGBTs and press-fit modules, the VMON System stands out as a complete reliability testing solution for next-generation power semiconductor devices.